Surface Analysis


The aim of this curricular unit is to familiarize students with techniques based on X-ray or charged particles used for surface characterization and available in the Department of Physics such as electron spectroscopy and secondary ion
mass spectrometry. They are expected to integrate knowledge by understanding for example the application of the photoelectric effect or
the Auger effect for analytical purposes and by studying the application of vacuum and charged particles technology for that purpose. In this way, students are expected to be prepared to perform tasks related to analytical equipment
that uses charged particles and related instrumentation.
Students will also learn about the interaction of particles in solids and the differences between surface and material analysis. Students should also acquire transversal skills such as the development of scientific reasoning, knowledge integration
and practical application of physical concepts.

General characterization





Responsible teacher

Ana Cristina Gomes da Silva


Weekly - 2

Total - 30

Teaching language



Solid state Physics

Vacuum Technology

Charged particles optics


Quantum mechanics


Surface Science,

K.Oura, ..M. Katayama,


ISBN  3-540-00545-5


Surface and Thin Film Analysis

Gernot Friedbacher (Editor), Henning Bubert (Editor)

ISBN: 978-3-527-32047-9

April 2011

Teaching method

Assuming a minimum number of students of 10 students. 
(If this minimum is not met, the teaching method will be adjusted).
The program will be built around each technique, 
describing the physical principles involved and the instrumentation required. 
The contents will be exposed through theoretical-practical classes. 
Laboratory work sessions are planned in the research laboratory ed XPS, 
multi-technical and SIMS.

Evaluation method


Trabalho no laboratório  - 2 grupos de 3 e um grupo de 4. Com Entrega de relatórioem conjunto.


Teste individual.

Entrega de um trabalho individual.

Trazercomputador para a aula a partir 4ª aula.


Regime Tutorial a partir da 7ª/8ª aulas

Frequência: presença 2/3 de aulas + laboratório XPS e SIMS + relatórios positivo.



Avaliação: Teste 50% + Lab 20% (emgrupo) + 30% trabalho individual (com apresentação de 10 minutos)


Entrega de relatórios – 15 diasapós trabalho

Entrega de trabalho escrito - estiloartigocientífico: 2 de Dezembro

Envio de slides por e-mail até 9 de Dez.

Apresentação oral de trabalhos: todos no Dia 16 de Dezembro

Data teste: previsão 18 de Outubro com a matéria até aula anterior.

Subject matter

Surface analysis versus materials analysis.
2- The electron microscope (SEM and TEM). Microanalysis and high pressure SEM.
3- Secondary Ion Mass Spectrometry (SIMS).
4- Scanning Auger Microscopy (SAM and AES).
5- X-ray photoelectron spetroscopy (XPS).


Programs where the course is taught: