Applied Nuclear Physics
Objectives
The goal for this unit is familiarize the students with those techniques based in charged particle beams used for materials and surface characterization and available the Physics department or at partner institutions.
Students should become prepared for jobs related with analytical techniques based in charged particles.
General characterization
Code
12539
Credits
3.0
Responsible teacher
João Duarte Neves Cruz
Hours
Weekly - 2
Total - 28
Teaching language
Português
Prerequisites
Students should have a good background on Atomic and Molecular Physics, Nuclear Physics, vaccum technology and charged particle optics.
Bibliography
Handbook of Modern Ion Beam Materials Analysis
Michael A Nastasi, Joseph R Tesmer
ISBN:1558992545
Teaching method
Available soon
Evaluation method
Available soon
Subject matter
Analytical techniques based on acelerated beams (0.5 - 4 MeV):
1. Interaction of charged particles with matter (revision); stopping power; impact parameter; cross section.
2. X-ray emission induced by proton bombardment (PIXE) - physical principles, essential parameters; qualitative and quantitative analysis; instrumentation.
3. Gamma and particle emission in nuclear reactions induced by protons (PIGE/NRA) - physical principles, essential parameters; qualitative and quantitative analysis; depth profiling; instrumentation.
4. Rutherford and nuclear elastic scattering (RBS/EBS) - physical principles, essential parameters; qualitative and quantitative analysis; depth profiling; instrumentation.
Analytical techniques based on slow neutrons:
Neutron Activation - physical principles, essential parameters; qualitative and quantitative analysis; instrumentation.